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KMID : 0362420050430030338
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Journal of Korean Academy of Prosthodontics
2005 Volume.43 No. 3 p.338 ~ p.351
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Fit of fixture/abutment/screw interfaces of internal connection implant system
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Kim Jin-Sup
Kim Hee-Jung
Chung Chae-Heon
Back Dae-Hwa
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Abstract
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Statement of problem: Accurate fit between the implant components is important because the misfit of the implant components results in frequent screw loosening, irreversible screw fracture, plaque accumulation, poor soft tissue reaction, and destruction of osseointegration.
Purpose: This study is to evaluate the machining accuracy and consistency of the implant fixture/abutment/screw interfaces of the internal connection system by using a Stereoscopic Zoom microscope and FE-SEM(field emission scanning electron microscope)
Materials & Methods: The implant systems selected in this study were internal connection type implants from AVANA(Osstem(R)), Bioplant(Cowell-Medi(R)), Dio(DIO(R)), Neoplant(Neobiotech (R)), Implantium(Dentium(R))systems. Each group was acquired 2 fixtures at random. Two piece type abutment and one piece type abutment for use with each implant system were acquired. Screw were respectively used to hold a two piece type abutment to a implant fixture. The implant fixtures were perpendiculary mounted in acrylic resin block. Each two piece abutment was secured to the implant fixture by screw and one piece abutment also secured to the implant fixture. Abutment/fixture assembly were mounted in liquid unsaturated polyester. All samples were cross-sectioned with grinder-polisher unit. Finally all specimens were analysed the fit between implant fixture/abutment/screw interfaces
Results & Conclusion: 1. Implant fixture/abutment/screw connection interfaces of internal connection systems made in Korea were in good condition. 2. The results of the above study showed that materials and mechanical properties and quality of milling differed depending on their manufacturing companies.
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KEYWORD
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internal connection implant system, Stereoscopic Zoom microscope, Field Emission Scanning Electron microscope(FE-SEM)
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